Indium oxide thin-film transistors processed at low temperature via ultrasonic spray pyrolysis

ACS Applied Materials and Interfaces

Volumn 7, Issue 1, 2015, Pages 782-790

  Faber, Hendrik ^a   Lin, Yen Hung ^a   Thomas, Stuart R ^a   Zhao, Kui ^b   Pliatsikas, Nikos ^c   McLachlan, Martyn A ^a   Amassian, Aram ^b   Patsalas, Panos A ^c   Anthopoulos, Thomas D ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b KING ABDULLAH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Saudi Arabia)

^c ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

Author keywords

metal oxide; plastic electronics; spray pyrolysis; thin film transistors

Indexed keywords

ELECTRIC FIELD EFFECTS; ELECTRON MOBILITY; ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INDIUM; SEMICONDUCTING FILMS; SPRAY PYROLYSIS; TEMPERATURE; THIN FILM TRANSISTORS; THIN FILMS; TRANSISTORS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

CROSS SECTIONAL TRANSMISSION ELECTRON MICROSCOPY; DEPOSITION TEMPERATURES; ELECTRICAL CHARACTERIZATION; INDIUM OXIDE THIN FILMS; METAL OXIDES; MICROSTRUCTURAL ANALYSIS; PLASTIC ELECTRONICS; ULTRASONIC SPRAY PYROLYSIS;

OXIDE FILMS;

EID: 84921263449     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am5072139     Document Type: Article

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