Accelerated reliability demonstration under competing failure modes

Reliability Engineering and System Safety

Volumn 136, Issue , 2015, Pages 75-84

  Luo, Wei ^a   Zhang, Chun Hua ^b   Chen, Xun ^b   Tan, Yuan Yuan ^b  

^a CHINA AERODYNAMICS RESEARCH AND DEVELOPMENT CENTER   (China)

^b NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY   (China)

Author keywords

Accelerated testing; Competing failure modes; Performance degradation; Reliability allocation; Reliability demonstration

Indexed keywords

DEMONSTRATIONS; RISK ASSESSMENT;

ACCELERATED TESTING; COMPETING FAILURE MODES; PERFORMANCE DEGRADATION; RELIABILITY ALLOCATION; RELIABILITY DEMONSTRATION;

FAILURE MODES;

EID: 84919830491     PISSN: 09518320     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ress.2014.11.014     Document Type: Article

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