Bayes approach in RDT using accelerated and long-term life data

Reliability Engineering and System Safety

Volumn 67, Issue 1, 2000, Pages 9-16

  Bris R ^a  

^a VSB TECHNICAL UNIVERSITY OF OSTRAVA   (Czech Republic)

Author keywords

Accelerated testing; Bayes analysis; Censored data; Estimation of failure rate; Posterior risk; Reliability

Indexed keywords

EID: 0006194980     PISSN: 09518320     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0951-8320(99)00025-3     Document Type: Article

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