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Volumn 58, Issue 4, 2009, Pages 604-610

Reliability demonstration through degradation bogey testing

Author keywords

Bogey test; Degradation; Optimum plan; Reliability demonstration; Sensitivity analysis

Indexed keywords

BOGEY TEST; CONDITIONAL FAILURE PROBABILITY; DECISION RULES; DEGRADATION MODELING; DEGREE OF CONFIDENCE; FAILURE TESTING; HIGH CONFIDENCE; MEASUREMENT DATA; MODEL PARAMETERS; OPTIMUM PLAN; PERFORMANCE CHARACTERISTICS; RELIABILITY DEMONSTRATION; SAMPLE SIZES; TEST COST; TEST METHOD; TEST PLAN; TEST TIME; TEST UNIT; TYPE II ERROR;

EID: 77957932163     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2009.2033733     Document Type: Article
Times cited : (53)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.