-
2
-
-
0001327611
-
Truncated life tests in the exponential case
-
Epstein, B., Truncated life tests in the exponential case. Annals of Math. Stat., 25 (1954) 555-564.
-
(1954)
Annals of Math. Stat.
, vol.25
, pp. 555-564
-
-
Epstein, B.1
-
3
-
-
30244476243
-
Double sample test for hypotheses about the mean of an exponential distribution
-
Bulgren, W. & Hewette, J., Double sample test for hypotheses about the mean of an exponential distribution. Technometrics, 15 (1973) 187-190.
-
(1973)
Technometrics
, vol.15
, pp. 187-190
-
-
Bulgren, W.1
Hewette, J.2
-
4
-
-
0024016112
-
A two-stage life test for the exponential parameter
-
Fairbanks, K., A two-stage life test for the exponential parameter. Technometrics, 30 (1988) 175-180.
-
(1988)
Technometrics
, vol.30
, pp. 175-180
-
-
Fairbanks, K.1
-
5
-
-
0006770698
-
Sequential life test in the exponential case
-
Epstein, B. & Sobel, M., Sequential life test in the exponential case. Annals of Math. Stat., 26 (1955) 82-93.
-
(1955)
Annals of Math. Stat.
, vol.26
, pp. 82-93
-
-
Epstein, B.1
Sobel, M.2
-
6
-
-
30244437174
-
Some comments on truncated sequential tests for the exponential distribution
-
Aroian, L.A., Some comments on truncated sequential tests for the exponential distribution. Industrial Quality Control, 21 (1964) 309-312.
-
(1964)
Industrial Quality Control
, vol.21
, pp. 309-312
-
-
Aroian, L.A.1
-
10
-
-
0016969747
-
An evaluation of exponential and Weibull test plans
-
Harter, H.L. & Moore, A.H., An evaluation of exponential and Weibull test plans. IEEE Trans. Reliab., R-25 (1976) 100-104.
-
(1976)
IEEE Trans. Reliab.
, vol.R-25
, pp. 100-104
-
-
Harter, H.L.1
Moore, A.H.2
-
12
-
-
0011701871
-
Life-test sampling plans for two-parameter Weibull population
-
Fertig, K.W. & Mann, N.R., Life-test sampling plans for two-parameter Weibull population. Technometrics, 22 (1980) 165-177.
-
(1980)
Technometrics
, vol.22
, pp. 165-177
-
-
Fertig, K.W.1
Mann, N.R.2
-
13
-
-
0024656381
-
Failure-censored variables-sampling plans for lognormal and Weibull distributions
-
Schneider, H., Failure-censored variables-sampling plans for lognormal and Weibull distributions. Technometrics, 31 (1989) 199-206.
-
(1989)
Technometrics
, vol.31
, pp. 199-206
-
-
Schneider, H.1
-
14
-
-
0013371541
-
Bayesian analysis of the Weibull process with unknown scale parameter and its application to acceptance sampling
-
Soland, R.M., Bayesian analysis of the Weibull process with unknown scale parameter and its application to acceptance sampling. IEEE Trans. Reliab., R-17 (1968) 84-90.
-
(1968)
IEEE Trans. Reliab.
, vol.R-17
, pp. 84-90
-
-
Soland, R.M.1
-
15
-
-
21544454540
-
Bayesian single sampling plans for life testing with truncation of the number of failures
-
Thyregod, P., Bayesian single sampling plans for life testing with truncation of the number of failures. Scandinavian J. Stat., 2 (1975) 61-70.
-
(1975)
Scandinavian J. Stat.
, vol.2
, pp. 61-70
-
-
Thyregod, P.1
-
16
-
-
30244478744
-
Bayesian life test sampling plans for the two parameter exponential distribution
-
Nigm, A.M. & Ismail, M.A., Bayesian life test sampling plans for the two parameter exponential distribution. Commun. Stat. Simula. Computa., 14 (1985) 691-707.
-
(1985)
Commun. Stat. Simula. Computa.
, vol.14
, pp. 691-707
-
-
Nigm, A.M.1
Ismail, M.A.2
-
17
-
-
30244469060
-
A decisive predictive approach to the construction of sequential acceptance sampling plans for life times
-
Dunsmore, I.R. & Wright, D.E., A decisive predictive approach to the construction of sequential acceptance sampling plans for life times. Appl. Stat., 34 (1985) 1-13.
-
(1985)
Appl. Stat.
, vol.34
, pp. 1-13
-
-
Dunsmore, I.R.1
Wright, D.E.2
-
18
-
-
30244436199
-
Economic designs of life test sampling plans for repairable products
-
Bai, D.S. & Kwon, Y.I., Economic designs of life test sampling plans for repairable products. Engng Optimization, 20 (1993) 287-302.
-
(1993)
Engng Optimization
, vol.20
, pp. 287-302
-
-
Bai, D.S.1
Kwon, Y.I.2
-
19
-
-
0001219460
-
Determination of warranty reserves
-
Menke, W.W., Determination of warranty reserves. Management Sci., 15 (1969) 542-549.
-
(1969)
Management Sci.
, vol.15
, pp. 542-549
-
-
Menke, W.W.1
-
20
-
-
0004371784
-
How much is a guarantee worth?
-
Heschel, M., How much is a guarantee worth?. Industrial Engng, 3 (1971) 14-15.
-
(1971)
Industrial Engng
, vol.3
, pp. 14-15
-
-
Heschel, M.1
-
21
-
-
0021598384
-
A general model for estimating warranty costs for repairable products
-
Nguyen, D.G. & Murthy, D.N.P., A general model for estimating warranty costs for repairable products. IIE Trans., 16 (1984) 379-386.
-
(1984)
IIE Trans.
, vol.16
, pp. 379-386
-
-
Nguyen, D.G.1
Murthy, D.N.P.2
-
22
-
-
0020796754
-
Optimum warranty policies for the nonrepairable items
-
Thomas, M.U., Optimum warranty policies for the nonrepairable items. IEEE Trans. Reliab., R-32 (1983) 282-288.
-
(1983)
IEEE Trans. Reliab.
, vol.R-32
, pp. 282-288
-
-
Thomas, M.U.1
-
23
-
-
84946645276
-
The compound hyper geometric distribution and a system of single sampling inspection plans based on prior distributions and costs
-
Hald, A., The compound hyper geometric distribution and a system of single sampling inspection plans based on prior distributions and costs. Technometrics, 2 (1960) 275-340.
-
(1960)
Technometrics
, vol.2
, pp. 275-340
-
-
Hald, A.1
-
24
-
-
0010773375
-
Rectifying inspection for nonconforming items and the hald linear cost model
-
Guenther, W.C., Rectifying inspection for nonconforming items and the hald linear cost model. J. Quality Tech., 17 (1985) 81-85.
-
(1985)
J. Quality Tech.
, vol.17
, pp. 81-85
-
-
Guenther, W.C.1
-
25
-
-
0023594230
-
Optimal Bayesian single-sampling attributes plans with modified beta prior distribution
-
Tagaras, G. & Lee, H.L., Optimal Bayesian single-sampling attributes plans with modified beta prior distribution. Naval Res. Log., 34 (1987) 789-801.
-
(1987)
Naval Res. Log.
, vol.34
, pp. 789-801
-
-
Tagaras, G.1
Lee, H.L.2
-
26
-
-
30244540718
-
Gamma prior distribution selection for Bayesian analysis of failure rate and reliability
-
Waller, R.A., Johnson, M.M., Waterman, M.S. & Martz, H.F., Gamma prior distribution selection for Bayesian analysis of failure rate and reliability. Nuclear Systems Reliab. Engng and Risk Assessment, X (1977) 584-606.
-
(1977)
Nuclear Systems Reliab. Engng and Risk Assessment
, vol.10
, pp. 584-606
-
-
Waller, R.A.1
Johnson, M.M.2
Waterman, M.S.3
Martz, H.F.4
-
27
-
-
0000279526
-
On moments of order statistics from the Weibull distribution
-
Lieblein, J., On moments of order statistics from the Weibull distribution. Annals of Math. Stat., 26 (1955) 330-333.
-
(1955)
Annals of Math. Stat.
, vol.26
, pp. 330-333
-
-
Lieblein, J.1
|