Bayes reliability demonstration test plan for series-systems with binomial subsystem data

Proceedings of the Annual Reliability and Maintainability Symposium

Volumn , Issue , 1998, Pages 241-246

  Ten, Lin Mei ^a   Xie, Min ^a  

^a DSO NATIONAL LABORATORIES   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CURVE FITTING; MATHEMATICAL MODELS;

BAYESIAN RELIABILITY DEMONSTRATION TEST PLAN; MANN'S APPROXIMATELY OPTIMUM LOWER CONFIDENCE BOUND MODEL;

RELIABILITY THEORY;

EID: 0031647007     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)