메뉴 건너뛰기




Volumn 197, Issue 2, 2009, Pages 659-666

Design of accelerated life test sampling plans with a nonconstant shape parameter

Author keywords

Accelerated life test sampling plan; Failure censored; Nonconstant shape parameter; Time censored; Weibull distribution

Indexed keywords

ASYMPTOTIC ANALYSIS; DESIGN; RISK PERCEPTION; SAMPLING; STATISTICAL TESTS; TESTING;

EID: 60949095313     PISSN: 03772217     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ejor.2008.07.009     Document Type: Article
Times cited : (71)

References (16)
  • 1
    • 33749541601 scopus 로고
    • Design of failure-censored accelerated life tests sampling plans for lognormal and weibull Distribution
    • Bai D.S., Kim J.G., and Chun Y.R. Design of failure-censored accelerated life tests sampling plans for lognormal and weibull Distribution. Engineering Optimization 21 (1993) 197-212
    • (1993) Engineering Optimization , vol.21 , pp. 197-212
    • Bai, D.S.1    Kim, J.G.2    Chun, Y.R.3
  • 2
    • 0029181811 scopus 로고
    • Failure-censored accelerated life tests sampling plans for Weibull distribution under expected test time constraint
    • Bai D.S., Chun Y.R., and Kim J.G. Failure-censored accelerated life tests sampling plans for Weibull distribution under expected test time constraint. Reliability Engineering and System Safety 50 (1995) 61-68
    • (1995) Reliability Engineering and System Safety , vol.50 , pp. 61-68
    • Bai, D.S.1    Chun, Y.R.2    Kim, J.G.3
  • 3
    • 21844517410 scopus 로고
    • Failure-censored reliability sampling plans for the exponential distribution
    • Balasooriya U. Failure-censored reliability sampling plans for the exponential distribution. Journal of the Statistical Communication and Simulation 52 (1995) 337-349
    • (1995) Journal of the Statistical Communication and Simulation , vol.52 , pp. 337-349
    • Balasooriya, U.1
  • 4
    • 1942436347 scopus 로고    scopus 로고
    • Competing causes of failure and reliability tests for Weibull lifetimes under type I progressive censoring
    • Balasooriya U., and Low C.K. Competing causes of failure and reliability tests for Weibull lifetimes under type I progressive censoring. IEEE Transactions on Reliability 53 (2004) 29-36
    • (2004) IEEE Transactions on Reliability , vol.53 , pp. 29-36
    • Balasooriya, U.1    Low, C.K.2
  • 5
    • 0011578218 scopus 로고    scopus 로고
    • Reliability sampling plans for the tow-parameter exponential distribution under progressive censoring
    • Balasooriya U., and Saw L.C. Reliability sampling plans for the tow-parameter exponential distribution under progressive censoring. Journal of Applied Statistics 25 (1998) 707-714
    • (1998) Journal of Applied Statistics , vol.25 , pp. 707-714
    • Balasooriya, U.1    Saw, L.C.2
  • 6
    • 0034187355 scopus 로고    scopus 로고
    • Progressively censored reliability sampling plans for the Weibull distribution
    • Balasooriya U., Saw L.C., and Gadag V. Progressively censored reliability sampling plans for the Weibull distribution. Technometrics 42 (2000) 160-167
    • (2000) Technometrics , vol.42 , pp. 160-167
    • Balasooriya, U.1    Saw, L.C.2    Gadag, V.3
  • 7
    • 0011701871 scopus 로고
    • Life-test sampling plans for two-parameter Weibull populations
    • Fertig K.W., and Mann N.R. Life-test sampling plans for two-parameter Weibull populations. Technometrics 22 (1980) 165-177
    • (1980) Technometrics , vol.22 , pp. 165-177
    • Fertig, K.W.1    Mann, N.R.2
  • 8
    • 0024663023 scopus 로고
    • Lifetime of oxide and oxide-nitro-oxide dielectrics within trench capacitors for DRAM's
    • Hiergeist P., Spitzer A., and Rohl S. Lifetime of oxide and oxide-nitro-oxide dielectrics within trench capacitors for DRAM's. IEEE Transactions on Electron Devices 36 (1989) 913-919
    • (1989) IEEE Transactions on Electron Devices , vol.36 , pp. 913-919
    • Hiergeist, P.1    Spitzer, A.2    Rohl, S.3
  • 9
    • 33749563739 scopus 로고
    • Accelerated life test sampling plans for exponential distribution
    • Hsiesh H.K. Accelerated life test sampling plans for exponential distribution. Communication in Statistics-Simulation 23 (1994) 27-41
    • (1994) Communication in Statistics-Simulation , vol.23 , pp. 27-41
    • Hsiesh, H.K.1
  • 10
    • 0011701277 scopus 로고
    • One- and two-sided sampling plans based on the exponential distribution
    • Kockerlakota S., and Balakrishnan N. One- and two-sided sampling plans based on the exponential distribution. Naval Research Logistics Quarterly 33 (1986) 513-522
    • (1986) Naval Research Logistics Quarterly , vol.33 , pp. 513-522
    • Kockerlakota, S.1    Balakrishnan, N.2
  • 12
    • 0028374805 scopus 로고
    • Optimum accelerated life tests with a nonconstant scale parameter
    • Meeter C.A., and Meeker Jr. W.Q. Optimum accelerated life tests with a nonconstant scale parameter. Technometrics 36 (1994) 71-83
    • (1994) Technometrics , vol.36 , pp. 71-83
    • Meeter, C.A.1    Meeker Jr., W.Q.2
  • 14
    • 0016919169 scopus 로고
    • Theory for optimum censored accelerated life tests for normal and lognormal life distributions
    • Nelson W., and Kielpinski T.J. Theory for optimum censored accelerated life tests for normal and lognormal life distributions. Technometrics 18 (1976) 105-114
    • (1976) Technometrics , vol.18 , pp. 105-114
    • Nelson, W.1    Kielpinski, T.J.2
  • 15
    • 0024656381 scopus 로고
    • Failure-censored variable-sampling plans for lognormal and Weibull distributions
    • Schneider H. Failure-censored variable-sampling plans for lognormal and Weibull distributions. Technometrics 31 (1989) 199-206
    • (1989) Technometrics , vol.31 , pp. 199-206
    • Schneider, H.1
  • 16
    • 33749547784 scopus 로고
    • Development of life-test sampling plans for exponential distribution based on accelerated life testing
    • Yum B.J., and Kim S.H. Development of life-test sampling plans for exponential distribution based on accelerated life testing. Communications in Statistics-Theory and Methodology 19 (1990) 2735-2743
    • (1990) Communications in Statistics-Theory and Methodology , vol.19 , pp. 2735-2743
    • Yum, B.J.1    Kim, S.H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.