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Volumn 30, Issue 6, 2003, Pages 709-718

Reliability sampling plans for the Weibull distribution under Type II progressive censoring with binomial removals

Author keywords

[No Author keywords available]

Indexed keywords

STATISTICAL ANALYSIS;

EID: 0038602798     PISSN: 02664763     EISSN: None     Source Type: Journal    
DOI: 10.1080/0266476032000053781     Document Type: Article
Times cited : (30)

References (16)
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    • Balasooriya, U.1    Balakrishnan, N.2
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    • Reliability sampling plans for the two-parameter exponential distribution under progressive censoring
    • BALASOORIYA, U. & SAW, L. C. (1998) Reliability sampling plans for the two-parameter exponential distribution under progressive censoring, Journal of Applied Statistics, 25, pp. 707-714.
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    • Balasooriya, U.1    Saw, L.C.2
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    • Progressively censored reliability sampling plans for the Weibull distribution
    • BALASOORIYA, U., SAW, L. C. & GADAG, V. (2000) Progressively censored reliability sampling plans for the Weibull distribution, Technometrics, 42, pp. 160-167.
    • (2000) Technometrics , vol.42 , pp. 160-167
    • Balasooriya, U.1    Saw, L.C.2    Gadag, V.3
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    • Life-test sampling plans for two-parameter Weibull populations
    • FERTIG, K. W. & MANN, N. R. (1980) Life-test sampling plans for two-parameter Weibull populations, Technometrics, 22, pp. 165-177.
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  • 9
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    • HOSONO, Y., OHTA, H. & KASE, S. (1981) Design of single sampling plans for doubly exponential characteristics. In: H. J. LENZ, G. B. WETHERILL & P. T. WILRICH (Eds) Frontiers in Quality Control, pp. 94-112 (Vienna, Physica-Verlag).
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.