An approach for the advanced planning of a reliability demonstration test based on a Bayes procedure

Proceedings of the Annual Reliability and Maintainability Symposium

Volumn , Issue , 2003, Pages 288-294

  Krolo, Anna ^a   Bertsche, Bernd ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

Author keywords

Bayes statistics; Decrease factor; Prior knowledge; Sample size; Weibull distribution

Indexed keywords

FAILURE ANALYSIS; FATIGUE OF MATERIALS; PLANNING; PRODUCT DEVELOPMENT; STATISTICAL METHODS; WEIBULL DISTRIBUTION;

BAYES STATISTICS; FATIGUE DAMAGE CALCULATIONS; PRODUCT RELIABILITY;

RELIABILITY THEORY;

EID: 0037255919     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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