Comparisons of exponential life test plans with intermittent inspections

Journal of Quality Technology

Volumn 32, Issue 3, 2000, Pages 217-230

  Kim, Sun Ho ^a   Yum, Bong Jin ^b,c  

^a Agency for Defence Development   (South Korea)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^c Department of Industrial Engineering ^*  (South Korea)

Author keywords

Censored Data; Data; Grouped; Inspection; Life Testing; Maximum Likelihood Estimator

Indexed keywords

EID: 18544390559     PISSN: 00224065     EISSN: None     Source Type: Journal    
DOI: 10.1080/00224065.2000.11979998     Document Type: Article

References (14)

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