Competing causes of failure and reliability tests for Weibull lifetimes under type I progressive censoring

IEEE Transactions on Reliability

Volumn 53, Issue 1, 2004, Pages 29-36

  Balasooriya, Uditha ^a   Low, C K ^b  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Acceptance sampling; Competing causes of failure; Extreme value distribution; Reliability; Type I progressive censoring; Weibull distribution

Indexed keywords

CONSTRAINT THEORY; FAILURE ANALYSIS; MATRIX ALGEBRA; MAXIMUM LIKELIHOOD ESTIMATION; SAMPLING; STATISTICAL TESTS; WEIBULL DISTRIBUTION;

ACCEPTANCE SAMPLING; COMPETING CAUSES OF FAILURE; EXTREME VALUE DISTRIBUTION; PROGRESSIVE CENSORING; RELIABILITY TESTS; WEIBULL LIFETIMES;

RELIABILITY;

EID: 1942436347     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2003.821947     Document Type: Article

References (17)

1. A. C. Cohen, "Progressively censored samples in life testing," Technometrics, vol. 5, no. 4, pp. 327-339, 1963.
2. N. R. Mann, "Best linear invariant estimation for weibull parameters under progressive censoring," Technometrics, vol. 13, no. 3, pp. 521-533, 1971.
3. G. H. Lemon, "Maximum likelihood estimation for the three parameter weibull distribution based on censored samples," Technometrics, vol. 17, no. 2, pp. 247-254, 1975.
4. R. Viveros and N. Balakrishnan, "Interval estimation of parameters of life from respectively censored data," Technometrics, vol. 36, no. 1, pp. 84-91, 1994.
5. S. K. Tse and L. Xiang, "Interval estimation for weibull-distributed life data under type II progressive censoring with random removals," Biopharmaceutical Statistics, vol. 13, no. 1, pp. 1-16, 2003.
6. S. J. Wu, "Estimation for the two-paramater pareto distribution under progressive censoring with uniform removals," J. Stat. Comput. Sim., vol. 73, pp. 125-134, 2003.
7. N. Balakrishnan and R. Aggarwala, Progressive Censoring: Theory, Methods and Applications. Boston: Birkhäuser, 2000.
8. U. Balasooriya, S. L. C. Saw, and V. G. Gadag, "Progressively censored reliability sampling plans for the wiebull distribution," Technometrics, vol. 42, no. 2, pp. 160-167, 2000.
9. U. Balasooriya and N. Balakrishnan, "Reliability sampling plans for the lognormal distribution based on progressively censored samples," IEEE Trans. Rel., vol. 49, pp. 199-203, 2000.
10. R. J. Herman and K. N. R. Patell, "Maximum likelihood estimation for multi-risk model," Technometrics, vol. 13, no. 2, pp. 385-396, 1971.
11. M. L. Moeschberger and H. A. David, "Life tests under competing causes of failure and the theory of competing risks," Biometrics, vol. 27, no. 2, pp. 909-933, 1971.
12. M. J. Crowder, A. Kimber, R. Smith, and T. Sweeting, Statistical Analysis of Reliability Data. London: Chapman and Hall, 1991.
13. D. Hoel, "A representation of mortality data by competing risks," Biometrics, vol. 28, pp. 475-488, 1972.
14. A. V. Gajjar and C. G. Khatri, "Progressively censored samples from log-normal and logistic distributions," Technometrics, vol. 11, no. 4, pp. 793-803, 1969.
15. G. J. Lieberman and G. J. Resnikoff, "Sampling plans for inspection by variables," J. Amer. Stat. Association, vol. 50, pp. 457-516, 1955.
16. H. Schneider, "Failure-censored variables-sampling plans for lognormal and weibull distributions," Technometrics, vol. 31, no. 2, pp. 199-206, 1989.
17. G. C. Montanari and M. Cacciari, "Progressively-censored aging tests on XLPE-insulated cable models," IEEE Trans. Rel., vol. 23, pp. 365-372, 1988.