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Volumn 14, Issue 12, 2014, Pages 6964-6970

Effective passivation of exfoliated black phosphorus transistors against ambient degradation

Author keywords

atomic layer deposition; field effect transistor; Phosphorene; stability; water

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC LAYER DEPOSITION; CONVERGENCE OF NUMERICAL METHODS; CRYSTAL ATOMIC STRUCTURE; ELECTRIC FORCE MICROSCOPY; ELECTROSTATIC FORCE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; PASSIVATION; PHOSPHORUS; PHOTODEGRADATION; SELF ASSEMBLED MONOLAYERS; THRESHOLD VOLTAGE; TRANSMISSION ELECTRON MICROSCOPY; WATER; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84916611866     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl5032293     Document Type: Article
Times cited : (1426)

References (46)
  • 2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.