SCOPUS 정보 검색 플랫폼

Advanced Materials

Volumn 26, Issue 46, 2014, Pages 7710-7729

Recent progress on synchrotron-based in-situ soft X-ray spectroscopy for energy materials

(3) Liu, Xiaosong a,b Yang, Wanli b Liu, Zhi a,b,c

a SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY (China)

b LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

c SHANGHAITECH UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY; LIGHT SOURCES; PHOTOELECTRON SPECTROSCOPY; PHOTONS; SCHEDULING; SYNCHROTRON RADIATION; X RAY ABSORPTION SPECTROSCOPY;

CRITICAL RESEARCHES; FURTHER DEVELOPMENT; HIGH RESOLUTION DETECTION; IN-SITU INSTRUMENTS; SAMPLE ENVIRONMENT; SOFT X-RAY ABSORPTION SPECTROSCOPIES; SYNCHROTRON LIGHT SOURCE; X RAY EMISSION SPECTROSCOPY;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84915755698 PISSN: 09359648 EISSN: 15214095 Source Type: Journal
DOI: 10.1002/adma.201304676 Document Type: Article

Times cited : (133)

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