In situ soft X-ray dynamic microscopy of electrochemical processes

Electrochemistry Communications

Volumn 10, Issue 11, 2008, Pages 1680-1683

  Bozzini, Benedetto ^a   D'Urzo, Lucia ^a   Gianoncelli, Alessandra ^b   Kaulich, Burkhard ^b   Kiskinova, Maya ^b   Prasciolu, Mauro ^d   Tadjeddine, Abderrahmane ^c  

^a UNIVERSITY OF SALENTO   (Italy)

^b SINCROTRONE TRIESTE   (Italy)

^c CNRS   (France)

^d LABORATORIO TASC   (Italy)

Author keywords

Silver; Soft X rays; Spectromicroscopy

Indexed keywords

ABSORPTION; CORROSION; ELECTRIC BATTERIES; ELECTROLYTIC CELLS; SILVER; SODIUM CHLORIDE; SOLUTIONS; SUN; X RAY LITHOGRAPHY;

AQUEOUS SOLUTIONS; CORROSION PROCESSES; CORROSION PRODUCTS; ELECTROCHEMICAL; ELECTROCHEMICAL PROCESSES; GROWTH MORPHOLOGIES; HIGH VACUUMS; IMAGING; IN-SITU; LATERAL RESOLUTIONS; LIQUID ELECTROLYTES; MESOSCOPIC; MICROSCOPIC MEASUREMENTS; MODEL SYSTEMS; PHASE CONTRASTS; PILOT STUDIES; RAY DYNAMICS; SOFT X-RAYS; SPECTROMICROSCOPY; YIELDING;

X RAYS;

EID: 54149099531     PISSN: 13882481     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elecom.2008.08.039     Document Type: Article

References (17)

1. Günther S., Kaulich B., Gregoratti L., and Kiskinova M. Progress in Surface Science 70 4 (2002) 187
2. U. Neuhäusler, Soft X-ray Spectromicroscopy on Hydrated Colloidal and Environmental Science Samples, Ph.D. Thesis Georg-August-Universität, Göttingen, 1999.
3. Neuhäusler U., Jacobsen C., Schulze D., Stott D., and Abend S. J. Synchrotron Rad. 7 (2000) 110
4. U. Wiesemann, The Scanning Transmission X-Ray Microscope at BESSY II, Ph.D. Thesis Georg-August-Universität, Göttingen, 2003.
5. Drake I.J., Liu T.C.N., et al. Rev. Sci. Instrum. 75 (2004) 3242
6. Fuchs O., Maier F., et al. Nucl. Instrum. Meth. A 585 3 (2008) 172
7. Lützenkirchen-Hecht D., Waligura C.U., and Strehblow H.-H. Corr. Sci. 40 (1998) 1037
8. Guay D., Stewart-Ornstein J., Zhang X., and Hitchcok A.P. Anal. Chem. 77 (2005) 3479
9. A. Bianco, G. Sostero, B. Nelles, K.F. Heidemann, D. Cocco, Proc. SPIE, San Diego, CA, USA, Conf. Proc., 5918 (2005) 591810 (31 Jul-3 Aug).
10. B. Kaulich, D. Bacescu, et al., Proc. 8th Int. Conf. X-ray Microscopy, Egret Himeji, Japan, Conf. Proc. Series IPAP, 7 (2006) 22 (26-30 Jul, 2005).
11. Gianoncelli A., Morrison G.R., et al. Appl. Phys. Lett. 89 (2006) 251117
12. Wilhein T., Kaulich B., et al. Appl. Phys. Lett. 78 14 (2001) 2082
13. Kaulich B., Wilhein T., et al. J. Opt. Soc. Am. Optic. Image. Sci. Vis. 19 4 (2002) 797
14. G.R. Morrison, A. Gianoncelli, B. Kaulich, D. Bacescu, J. Kovac, Proc. 8th Int. Conf. X-ray Microscopy, Egret Himeji, Japan, Conf. Proc. Series IPAP, 7 (2006) 377 (26-30 Jul, 2005).
15. Bozzini B., Giovannelli G., et al. Corr. Sci. 48 (2006) 193
16. Bozzini B., Giovannelli G., and Mele C. Surf. & Coat. Technol. 201 (2007) 4619
17. Popov K.I., Djokic S.S., and Grgur B.N. Fundamental Aspects of Electrometallurgy (2002), Kluwer Academic Press, New York