SCOPUS 정보 검색 플랫폼

Journal of Electron Spectroscopy and Related Phenomena

Volumn 188, Issue , 2013, Pages 111-120

RIXS investigations of liquids, solutions, and liquid/solid interfaces

(10) Weinhardt, L a,b,c Blumc, M c Fuchs, O b Benkert, A a,b Meyerb, F b Bar, M c,d,e Denlinger, J D f Yang, W f Reinert, F b,f Heske, C a,c,g

a KARLSRUHE INSTITUTE OF TECHNOLOGY (Germany)

b UNIVERSITY OF WÜRZBURG (Germany)

c UNIVERSITY OF NEVADA (United States)

d HAHN MEITNER INSTITUT (Germany)

e BRANDENBURG UNIVERSITY OF TECHNOLOGY (Germany)

f LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

g KARLSRUHE INSTITUTE OF TECHNOLOGY (Germany)

Author keywords

In situ; Liquids; Nuclear dynamics; Rixs; X ray emission spectroscopy

Indexed keywords

DISSOCIATION; ELECTROMAGNETIC WAVE EMISSION; EMISSION SPECTROSCOPY; INTERFACES (MATERIALS); LIQUIDS; SEMICONDUCTING SELENIUM COMPOUNDS; SOLAR ABSORBERS; SOLUTIONS; SPECTROMETERS; THIN FILM SOLAR CELLS; X RAY SCATTERING; X RAY SPECTROMETERS;

EXPERIMENTAL APPROACHES; LIQUID-SOLID INTERFACES; LIQUID/SOLID INTERFACE; NUCLEAR DYNAMICS; RESONANT INELASTIC SOFT X-RAY SCATTERING; RIXS; SOFT-X-RAY SPECTROMETERS; X RAY EMISSION SPECTROSCOPY;

PHASE INTERFACES;

EID: 84886095794 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/j.elspec.2012.10.006 Document Type: Article

Times cited : (45)

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