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Applied Surface Science

Volumn 255, Issue 3, 2008, Pages 764-766

The local electronic structure of tin phthalocyanine studied by resonant soft X-ray emission spectroscopies

(8) Peltekis, N a Holland, B N a Piper, L F J b DeMasi, A b Smith, K E b Downes, J E c McGovern, I T a McGuinness, C a

a TRINITY COLLEGE DUBLIN (Ireland)

b Boston University (United States)

c MACQUARIE UNIVERSITY (Australia)

Author keywords

Resonant X ray emission spectroscopy; SnPc; Tin phthalocyanine; X ray absorption spectroscopy; X ray fluorescence

Indexed keywords

CARBON FILMS; ELECTROMAGNETIC WAVE EMISSION; ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY; LIGHT ABSORPTION; MULTILAYERS; SELF ASSEMBLY; SITE SELECTION; TIN; X RAY ABSORPTION SPECTROSCOPY; X RAY SCATTERING; X RAYS;

LOCAL ELECTRONIC STRUCTURES; NEAR-EDGE X-RAY ABSORPTION FINE STRUCTURE SPECTRUM; PROJECTED DENSITY OF STATE; RESONANT X-RAY EMISSION SPECTROSCOPIES; SNPC; SOFT X RAY EMISSION SPECTROSCOPY; TIN-PHTHALOCYANINE; X RAY FLUORESCENCE;

DENSITY FUNCTIONAL THEORY;

EID: 55649093087 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2008.07.058 Document Type: Article

Times cited : (5)

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