Electronic structure in thin film organic semiconductors studied using soft X-ray emission and resonant inelastic X-ray scattering

Thin Solid Films

Volumn 515, Issue 2 SPEC. ISS., 2006, Pages 394-400

  Zhang, Yufeng ^a   Downes, James E ^b   Wang, Shancai ^a   Learmonth, Timothy ^a   Plucinski, Lukasz ^a   Matsuura, A Y ^a,c   McGuinness, Cormac ^a   Glans, Per Anders ^a   Bernardis, Sarah ^a   O'Donnell, Cian ^a   Smith, Kevin E ^a  

^a Boston University   (United States)

^b VICTORIA UNIVERSITY OF WELLINGTON   (New Zealand)

^c AIR FORCE OFFICE OF SCIENTIFIC RESEARCH   (United States)

Author keywords

Organic semiconductors; X ray emission

Indexed keywords

CHARGE TRANSFER; ELECTRONIC STRUCTURE; NITROGEN COMPOUNDS; PHOTOEMISSION; SPECTROSCOPIC ANALYSIS; THIN FILMS; X RAY SCATTERING;

CHARGE TRANSFER TRANSITIONS; DENSITY FUNCTIONAL CALCULATIONS; MOLECULAR ORBITAL MODELS; X-RAY EMISSION SPECTROSCOPY;

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 33748901123     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.12.221     Document Type: Article

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