High-resolution tunable spectrograph for x-ray laser linewidth measurements with a plane varied-line-spacing grating

Journal of Engineering and Applied Science

Volumn 36, Issue 21, 1997, Pages 4913-4921

  Underwood, James H ^a   Koch, Jeffrey A ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; OPTICAL DESIGN; OPTICAL RESOLVING POWER; OPTICAL VARIABLES MEASUREMENT; OPTIMIZATION; X RAY CAMERAS; X RAY LASERS;

LINEWIDTH MEASUREMENTS;

X RAY SPECTROGRAPHS;

EID: 0031187414     PISSN: 11101903     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (24)