High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies

Journal of Synchrotron Radiation

Volumn 17, Issue 5, 2010, Pages 631-643

  Strocov, V N ^a   Schmitt, T ^a   Flechsig, U ^a   Schmidt, T ^a   Imhof, A ^a   Chen, Q ^a   Raabe, J ^a   Betemps, R ^a   Zimoch, D ^a   Krempasky, J ^a   Wang, X ^a,b   Grioni, M ^b   Piazzalunga, A ^a,c   Patthey, L ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b EPFL   (Switzerland)

^c POLITECNICO DI MILANO   (Italy)

Author keywords

angle resolved photoelectron spectroscopy; ellipsoidal refocusing optics; fixed gap undulator; grating optimization; plane grating monochromator; resonant inelastic X ray scattering; soft X ray beamline; Swiss Light Source; X ray optics

Indexed keywords

ANGLE RESOLVED PHOTOELECTRON SPECTROSCOPY; ELLIPSOIDAL REFOCUSING OPTICS; GRATING MONOCHROMATOR; GRATING OPTIMIZATION; RESONANT INELASTIC X-RAY SCATTERING; SOFT X-RAY BEAMLINE; SWISS LIGHT SOURCES; UNDULATORS;

CARRIER CONCENTRATION; ELECTRONS; FLIGHT CONTROL SYSTEMS; LIGHT; LIGHT SOURCES; LONGITUDINAL CONTROL; MONOCHROMATORS; OPTIMIZATION; PHOTOELECTRICITY; PHOTONS; POLARIZATION; SCATTERING; SINGLE CRYSTAL SURFACES; WIGGLERS; X RAY SCATTERING; X RAYS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 77955940240     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049510019862     Document Type: Article

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