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Volumn 42, Issue 13, 2013, Pages 5833-5857

Investigation of solid/vapor interfaces using ambient pressure X-ray photoelectron spectroscopy

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EID: 84882372341     PISSN: 03060012     EISSN: 14604744     Source Type: Journal    
DOI: 10.1039/c3cs60057b     Document Type: Article
Times cited : (361)

References (262)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.