Bulk sensitive hard x-ray photoemission electron microscopy

Review of Scientific Instruments

Volumn 85, Issue 11, 2014, Pages

  Patt, M ^a   Wiemann, C ^a   Weber, N ^b   Escher, M ^b   Gloskovskii, A ^c   Drube, W ^c   Merkel, M ^b   Schneider, C M ^a,d  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b FOCUS GmbH   (Germany)

^c DESY   (Germany)

^d UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON MICROSCOPES; ELECTRONIC STRUCTURE; ELECTRONS; KINETIC ENERGY; PHOTOELECTRONS; PHOTOEMISSION; PHOTONS;

EFFECTIVE ATTENUATION LENGTH; ELECTRON KINETIC ENERGY; ENERGETIC ELECTRON; HARD X-RAY PHOTOELECTRON SPECTROSCOPY; HARD X-RAY PHOTOEMISSION; HIGH-LATERAL RESOLUTION; SPECTROMICROSCOPY; WELL-ESTABLISHED TECHNIQUES;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84913582608     PISSN: 00346748     EISSN: 10897623     Source Type: Journal    
DOI: 10.1063/1.4902141     Document Type: Article

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