Probing buried layers by photoelectron spectromicroscopy with hard x-ray excitation

Applied Physics Letters

Volumn 100, Issue 22, 2012, Pages

  Wiemann, C ^a   Patt, M ^a   Cramm, S ^a   Escher, M ^b   Merkel, M ^b   Gloskovskii, A ^c   Thiess, S ^d   Drube, W ^d   Schneider, C M ^a,e  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b FOCUS GmbH   (Germany)

^c JOHANNES GUTENBERG UNIVERSITY   (Germany)

^d DESY   (Germany)

^e UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BURIED LAYER; HARD X RAY; HARD X-RAY PHOTOEMISSION; HIGH-LATERAL RESOLUTION; PETRA III; PHOTOELECTRON SPECTROMICROSCOPY; PHOTOEMISSION MICROSCOPE; PHOTON ENERGY; PROOF-OF-PRINCIPLE EXPERIMENTS; X-RAY PHOTOEMISSION SPECTRA;

PHYSICAL PROPERTIES; PHYSICS;

X RAYS;

EID: 84862139431     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4722940     Document Type: Article

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