메뉴 건너뛰기




Volumn 130, Issue , 2013, Pages 54-62

Time-resolved magnetic imaging in an aberration-corrected, energy-filtered photoemission electron microscope

Author keywords

Aberration correction; Photoemission electron microscopy; TR PEEM; X PEEM

Indexed keywords

ABERRATION CORRECTION; ABERRATION-CORRECTED; ELECTROSTATIC DEFLECTION; FAST MAGNETIZATION; PHOTOEMISSION ELECTRON MICROSCOPE; PHOTOEMISSION ELECTRON MICROSCOPY; TR-PEEM; X-PEEM;

EID: 84880845256     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2013.03.005     Document Type: Article
Times cited : (7)

References (31)
  • 1
    • 32944481005 scopus 로고    scopus 로고
    • Development of the magnetic tunnel junction MRAM at IBM: from first junctions to a 16-Mb MRAM demonstrator chip
    • Gallagher W.J., Parkin S.S.P. Development of the magnetic tunnel junction MRAM at IBM: from first junctions to a 16-Mb MRAM demonstrator chip. IBM Journal of Research and Development 2006, 50:5-23.
    • (2006) IBM Journal of Research and Development , vol.50 , pp. 5-23
    • Gallagher, W.J.1    Parkin, S.S.P.2
  • 2
    • 41149099157 scopus 로고    scopus 로고
    • Who wins the nonvolatile memory race
    • Meijer G.I. Who wins the nonvolatile memory race. Science 2008, 319:1625-1626.
    • (2008) Science , vol.319 , pp. 1625-1626
    • Meijer, G.I.1
  • 4
    • 77950346810 scopus 로고    scopus 로고
    • Multiferroic domain boundaries as active memory devices: trajectories towards domain boundary engineering
    • Salje E.K.H. Multiferroic domain boundaries as active memory devices: trajectories towards domain boundary engineering. Chem Phys Chem 2010, 11:940-950.
    • (2010) Chem Phys Chem , vol.11 , pp. 940-950
    • Salje, E.K.H.1
  • 6
    • 35748974883 scopus 로고    scopus 로고
    • Nanoionics-based resistive switching memories
    • Waser R., Aono M. Nanoionics-based resistive switching memories. Nature Materials 2007, 6:833-840.
    • (2007) Nature Materials , vol.6 , pp. 833-840
    • Waser, R.1    Aono, M.2
  • 10
    • 0039126590 scopus 로고
    • Low energy electron microscopy
    • Bauer E. Low energy electron microscopy. Reports on Progress in Physics 1994, 57:895-938.
    • (1994) Reports on Progress in Physics , vol.57 , pp. 895-938
    • Bauer, E.1
  • 11
    • 0001194852 scopus 로고
    • Picosecond optoelectronic switching and gating in silicon
    • Auston D.H. Picosecond optoelectronic switching and gating in silicon. Applied Physics Letters 1975, 26:101-103.
    • (1975) Applied Physics Letters , vol.26 , pp. 101-103
    • Auston, D.H.1
  • 14
    • 27744498338 scopus 로고    scopus 로고
    • Quantitative analysis of magnetic excitations in landau flux-closure structures using synchrotron-radiation microscopy
    • Raabe J., Quitmann C., Back C.H., Nolting F., Johnson S., Buehler C. Quantitative analysis of magnetic excitations in landau flux-closure structures using synchrotron-radiation microscopy. Physical Review Letters 2005, 94:217204.
    • (2005) Physical Review Letters , vol.94 , pp. 217204
    • Raabe, J.1    Quitmann, C.2    Back, C.H.3    Nolting, F.4    Johnson, S.5    Buehler, C.6
  • 19
    • 70249146526 scopus 로고    scopus 로고
    • Influence of magnetocrystalline anisotropy on the magnetization dynamics of magnetic microstructures
    • Kaiser A.M., Wiemann C., Cramm S., Schneider C.M. Influence of magnetocrystalline anisotropy on the magnetization dynamics of magnetic microstructures. Journal of Physics: Condensed Matter 2009, 21:314008.
    • (2009) Journal of Physics: Condensed Matter , vol.21 , pp. 314008
    • Kaiser, A.M.1    Wiemann, C.2    Cramm, S.3    Schneider, C.M.4
  • 20
    • 84863534836 scopus 로고    scopus 로고
    • Deflection gating for time-resolved x-ray magnetic circular dichroism-photoemission electron microscopy using synchrotron radiation
    • Wiemann C., Kaiser A.M., Cramm S., Schneider C.M. Deflection gating for time-resolved x-ray magnetic circular dichroism-photoemission electron microscopy using synchrotron radiation. Review of Scientific Instruments 2012, 83:063706.
    • (2012) Review of Scientific Instruments , vol.83 , pp. 063706
    • Wiemann, C.1    Kaiser, A.M.2    Cramm, S.3    Schneider, C.M.4
  • 21
    • 0026155289 scopus 로고
    • Design and performance of a high-resolution photoelectron microscope
    • Rempfer G.F., Skoczylas W.P., Griffith O.H. Design and performance of a high-resolution photoelectron microscope. Ultramicroscopy 1991, 36:196-221.
    • (1991) Ultramicroscopy , vol.36 , pp. 196-221
    • Rempfer, G.F.1    Skoczylas, W.P.2    Griffith, O.H.3
  • 22
    • 84873160988 scopus 로고    scopus 로고
    • First experimental proof for aberration correction in XPEEM: resolution, transmission enhancement, and limitation by space charge effects
    • Schmidt Th., Sala A., Marchetto H., Umbach E., Freund H.J. First experimental proof for aberration correction in XPEEM: resolution, transmission enhancement, and limitation by space charge effects. Ultramicroscopy 2012, http://dx.doi.org/10.1016/j.ultramic.2012.11.004.
    • (2012) Ultramicroscopy
    • Schmidt, T.1    Sala, A.2    Marchetto, H.3    Umbach, E.4    Freund, H.J.5
  • 23
    • 85081458761 scopus 로고    scopus 로고
    • SPECS Surface Nano Analysis GmbH, Voltastr. 5, 13355 Berlin.
    • SPECS Surface Nano Analysis GmbH, Voltastr. 5, 13355 Berlin. http://www.specs.com.
  • 24
    • 77953535925 scopus 로고    scopus 로고
    • A new aberration-corrected, energy-filtered LEEM/PEEM instrument I. Principles and design
    • Tromp R.M., Hannon J.B., Ellis A.W., Wan W., Berghaus A., Schaff O. A new aberration-corrected, energy-filtered LEEM/PEEM instrument I. Principles and design. Ultramicroscopy 2010, 110(852):852-861.
    • (2010) Ultramicroscopy , vol.110 , Issue.852 , pp. 852-861
    • Tromp, R.M.1    Hannon, J.B.2    Ellis, A.W.3    Wan, W.4    Berghaus, A.5    Schaff, O.6
  • 25
    • 84875546032 scopus 로고    scopus 로고
    • A new aberration-corected, energy-filtered LEEM/PEEM instrument II. Operation and results
    • Tromp R.M., Hannon J.B., Wan W., Schaff O. A new aberration-corected, energy-filtered LEEM/PEEM instrument II. Operation and results. Ultramicroscopy 2012, http://dx.doi.org/10.1016/j.ultramic.2012.07.016.
    • (2012) Ultramicroscopy
    • Tromp, R.M.1    Hannon, J.B.2    Wan, W.3    Schaff, O.4
  • 27
    • 84859859319 scopus 로고    scopus 로고
    • A contrast transfer function approach for image calculations in standard and aberration-corrected LEEM and PEEM
    • Schramm S.M., Pang A.B., Altman M.S., Tromp R.M. A contrast transfer function approach for image calculations in standard and aberration-corrected LEEM and PEEM. Ultramicroscopy 2012, 115.
    • (2012) Ultramicroscopy , vol.115
    • Schramm, S.M.1    Pang, A.B.2    Altman, M.S.3    Tromp, R.M.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.