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Volumn 10, Issue 10, 2011, Pages 759-764

Probing bulk electronic structure with hard X-ray angle-resolved photoemission

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC STRUCTURE; ELECTRONS; PHOTOELECTRON SPECTROSCOPY; TRANSITION METALS; TUNGSTEN;

EID: 80053051406     PISSN: 14761122     EISSN: 14764660     Source Type: Journal    
DOI: 10.1038/nmat3089     Document Type: Article
Times cited : (184)

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