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Journal of Electron Spectroscopy and Related Phenomena

Volumn 100, Issue 1-3, 1999, Pages 137-160

Relationships between electron inelastic mean free paths, effective attenuation lengths, and mean escape depths

(2) Jablonski, A a Powell, C J b

a POLISH ACADEMY OF SCIENCES (Poland)

b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001699807 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/s0368-2048(99)00044-4 Document Type: Article

Times cited : (145)

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