How is it possible to obtain buried interface information through very thick films using a hard-X-ray PEEM?

Surface Science

Volumn 601, Issue 20 SPEC. ISS., 2007, Pages 4754-4757

  Kinoshita, Toyohiko ^a,f   Ikenaga, Eiji ^a,f   Kim, Jungjin ^a,f   Ueda, Shigenori ^a,f   Kobata, Masaaki ^a,f   Harries, James R ^a   Shimada, Kenya ^b   Ino, Akihiro ^b   Tamasaku, Kenji ^c   Nishino, Yoshinori ^c   Ishikawa, Tetsuya ^a,c   Kobayashi, Keisuke ^a,f   Drube, Wolfgang ^d   Kunz, Christof ^e  

^a Hiroshima University ^*  (Japan)

^b HIROSHIMA UNIVERSITY   (Japan)

^c RIKEN SPring 8 Center   (Japan)

^d DESY   (Germany)

^e UNIVERSITY OF HAMBURG   (Germany)

^f JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Hard X ray; PEEM; Photoemission; Plasmon; Secondary electrons

Indexed keywords

ELECTRON MICROSCOPY; MOMENTUM TRANSFER; PHOTOELECTRONS; PHOTOEMISSION; PLASMONS; SPECTRUM ANALYSIS; X RAY SPECTROSCOPY;

BURIED INTERFACE INFORMATION; HARD-X-RAY PHOTOELECTRON EMISSION MICROSCOPE (HX-PEEM); HIGH-ENERGY PHOTOELECTRONS; SECONDARY ELECTRONS;

THICK FILMS;

EID: 35148847305     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2007.05.043     Document Type: Article

References (7)

1. Wakita T., et al. Jpn. J. Appl. Phys. 45 (2006) 1886
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5. W. Drube et al., to be published.
6. See for example,. Hüfner S. Photoelectron Spectroscopy (1995), Springer, Berlin
7. Uwatoko T., Tanaka H., Nakayama K., Nagamatu S., Hatada K., Konishi T., Fujikawa T., Kinoshita T., Harasawa A., and Kakizaki A. Hyoumen-Kagaku 22 (2001) 497 (in Japanese)