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Volumn 85, Issue 8, 2014, Pages

Combining nanocalorimetry and dynamic transmission electron microscopy for in situ characterization of materials processes under rapid heating and cooling

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION PATTERNS; ELECTRON DIFFRACTION; INTERFEROMETRY; THERMOANALYSIS;

EID: 84908598216     PISSN: 00346748     EISSN: 10897623     Source Type: Journal    
DOI: 10.1063/1.4892537     Document Type: Article
Times cited : (38)

References (34)
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  • 11
    • 20344390046 scopus 로고    scopus 로고
    • Non-adiabatic thin-film (chip) nanocalorimetry
    • DOI 10.1016/j.tca.2005.01.073, PII S0040603105001061, Thermodynamics and Calorimetry of Thin Films: Papers Presented at the 8th Lahnwitzseminar on Calorimetry
    • A. A. Minakov, S. A. Adamovsky, and C. Schick, Thermochim. Acta 432, 177 (2005). 10.1016/j.tca.2005.01.073 (Pubitemid 40785934)
    • (2005) Thermochimica Acta , vol.432 , Issue.2 , pp. 177-185
    • Minakov, A.A.1    Adamovsky, S.A.2    Schick, C.3
  • 20
    • 34547751986 scopus 로고    scopus 로고
    • Rapid phase transformation kinetics on a nanoscale: Studies of the α → β transformation in pure, nanocrystalline Ti using the nanosecond dynamic transmission electron microscope
    • DOI 10.1016/j.actamat.2007.05.043, PII S1359645407003746
    • T. LaGrange, G. H. Campbell, P. E. A. Turchi, and W. E. King, Acta Mater. 55, 5211 (2007). 10.1016/j.actamat.2007.05.043 (Pubitemid 47241228)
    • (2007) Acta Materialia , vol.55 , Issue.15 , pp. 5211-5224
    • LaGrange, T.1    Campbell, G.H.2    Turchi, P.E.A.3    King, W.E.4
  • 21
    • 33747133300 scopus 로고    scopus 로고
    • Nanosecond time resolved electron diffraction studies of the α→β in pure Ti thin films using the dynamic transmission electron microscope (DTEM)
    • DOI 10.1007/s10853-006-0090-z
    • T. LaGrange, G. H. Campbell, J. D. Colvin, B. W. Reed, and W. E. King, J. Mater. Sci. 41, 4440 (2006). 10.1007/s10853-006-0090-z (Pubitemid 44221334)
    • (2006) Journal of Materials Science , vol.41 , Issue.14 , pp. 4440-4444
    • Lagrange, T.1    Campbell, G.H.2    Colvin, J.D.3    Reed, B.4    King, W.E.5
  • 32
    • 13744250966 scopus 로고    scopus 로고
    • Measurement of thermal conductivity of thin films with a Si-N membrane-based microcalorimeter
    • DOI 10.1063/1.1848658, 024901
    • B. L. Zink, B. Revaz, J. J. Cherry, and F. Hellman, Rev. Sci. Instrum. 76, 024901 (2005). 10.1063/1.1848658 (Pubitemid 40238217)
    • (2005) Review of Scientific Instruments , vol.76 , Issue.2 , pp. 0249011-0249015
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