Scanning AC nanocalorimetry combined with in-situ x-ray diffraction

Journal of Applied Physics

Volumn 113, Issue 24, 2013, Pages

  Xiao, Kechao ^a   Gregoire, John M ^b   McCluskey, Patrick J ^c   Dale, Darren ^d   Vlassak, Joost J ^a  

^a HARVARD UNIVERSITY   (United States)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^c GE GLOBAL RESEARCH   (United States)

^d Cornell High Energy Synchrotron Source ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMBINATORIAL DEVICES; COMPOSITION DEPENDENCE; HEATING AND COOLING RATES; HIGH TEMPERATURE; IN-SITU X-RAY DIFFRACTION; MELTING AND SOLIDIFICATION; SOLIDIFICATION PROCESS; TIME-RESOLVED XRD;

CALORIMETERS; CALORIMETRY; EXPERIMENTS; PHASE TRANSITIONS; SENSORS; SOLID STATE REACTIONS; TIN; X RAY DIFFRACTION;

SCANNING;

EID: 84879847266     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4811686     Document Type: Article

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