In-situ X-ray diffraction combined with scanning AC nanocalorimetry applied to a Fe0.84Ni0.16 thin-film sample

Applied Physics Letters

Volumn 102, Issue 20, 2013, Pages

  Gregoire, John M ^a   Xiao, Kechao ^b   McCluskey, Patrick J ^c   Dale, Darren ^d   Cuddalorepatta, Gayatri ^b   Vlassak, Joost J ^b  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b HARVARD UNIVERSITY   (United States)

^c GE GLOBAL RESEARCH   (United States)

^d Department of Obstetrics Gynecology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION TECHNIQUES; COMBINATORIAL STUDIES; COMPLEX MATERIALS; HIGH TEMPERATURE; IN-SITU X-RAY DIFFRACTION; NANOCALORIMETERS; STRUCTURAL MATERIAL PROPERTIES; TIME-RESOLVED X-RAY DIFFRACTION;

MARTENSITIC TRANSFORMATIONS; NICKEL; SCANNING; X RAY DIFFRACTION;

IRON COMPOUNDS;

EID: 84878357199     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4806972     Document Type: Article

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