A scanning AC calorimetry technique for the analysis of nano-scale quantities of materials

Review of Scientific Instruments

Volumn 83, Issue 11, 2012, Pages

  Xiao, Kechao ^a   Gregoire, John M ^b   McCluskey, Patrick J ^c   Vlassak, Joost J ^a  

^a HARVARD UNIVERSITY   (United States)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^c GE GLOBAL RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AC-CALORIMETRY; BULK MATERIALS; EXPERIMENTAL PARAMETERS; HEATING AND COOLING RATES; KINETICS OF PHASE TRANSFORMATION; MICROMACHINED; NANO SCALE; NANOCALORIMETRY; SCAN RATES; SCANNING CALORIMETRY; SCANNING RATE;

CALORIMETRY; SERPENTINE; SPECIFIC HEAT; TIN;

CALORIMETERS;

EID: 84870555365     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4763571     Document Type: Article

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