Significant improvements in stability and reproducibility of atomic-scale atomic force microscopy in liquid

Nanotechnology

Volumn 25, Issue 45, 2014, Pages

  Akrami, S M R ^a   Nakayachi, H ^a   Watanabe Nakayama, T ^a   Asakawa, H ^a   Fukuma, T ^a,b  

^a KANAZAWA UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Atomic force microscopy; Atomic resolution imaging; Tip treatment

Indexed keywords

ATOMIC SCALE; ATOMIC-RESOLUTION IMAGING; REPRODUCIBILITIES; TIP TREATMENT;

ATOMIC FORCE MICROSCOPY;

EID: 84908529856     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/25/45/455701     Document Type: Article

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