Ellipsometry analysis of a-Si:H solar cell structures with submicron-size textures using glass-side illumination

Thin Solid Films

Volumn 565, Issue , 2014, Pages 222-227

  Yamaguchi, Shinji ^a,b   Sugimoto, Yoshio ^b   Fujiwara, Hiroyuki ^a  

^a GIFU UNIVERSITY   (Japan)

^b DAINIPPON SCREEN MFG CO LTD   (Japan)

Author keywords

Ellipsometry; Texture; Thin film silicon solar cells

Indexed keywords

ELLIPSOMETRY; GLASS; OPTICAL MULTILAYERS; PROBES; SILICON SOLAR CELLS; SPECTROSCOPIC ELLIPSOMETRY; TEXTURES; TRANSMISSION ELECTRON MICROSCOPY;

A-SI:H SOLAR CELLS; HYDROGENATED AMORPHOUS SILICON (A-SI:H); MEASUREMENT CONFIGURATION; OPTICAL STRUCTURES; SOLAR CELL STRUCTURES; SPECULAR REFLECTIONS; STRUCTURAL CHARACTERIZATION; THIN-FILM SILICON SOLAR CELLS;

SILICON;

EID: 84905856263     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2014.06.025     Document Type: Article

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