Through-the-glass optical metrology for mapping 60 cm × 120 cm CdTe photovoltaic panels in off-line and on-line configurations

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2012, Pages 377-381

  Chen, Jie ^a   Koirala, Prakash ^a   Salupo, Carl ^a   Collins, R W ^a   Marsillac, Sylvain ^b   Kormanyos, Kenneth R ^c   Johs, Blaine D ^d   Hale, Jeffrey S ^d   Pfeiffer, Galen L ^d  

^a UNIVERSITY OF TOLEDO   (United States)

^b Old Dominion University   (United States)

^c Calyxo USA   (United States)

^d J A WOOLLAM CO INC   (United States)

Author keywords

ellipsometry; II VI semiconductor materials; metrology; photovoltaic cells; thin films

Indexed keywords

CDS; CDS LAYER; CDS/CDTE; CDTE; EFFECTIVE THICKNESS; ELLIPSOMETERS; INCIDENT POLARIZATION STATE; INTERFACE LAYER; LIGHT COLLECTION; LIMITED DATA; MAPPING ANALYSIS; MODEL DEVELOPMENT; MULTI-CHANNEL DETECTION SYSTEM; ON-LINE ANALYSIS; ON-LINE MEASUREMENT; OPTICAL METROLOGY; PHOTOVOLTAIC; PHOTOVOLTAIC PANELS; PV MODULES; ROBUST PARAMETERS; SIGNAL AVERAGING; SODA LIME GLASS; TRANSPARENT CONDUCTING OXIDE;

CADMIUM COMPOUNDS; CADMIUM SULFIDE; CADMIUM TELLURIDE; ELLIPSOMETRY; HETEROJUNCTIONS; MAPPING; MEASUREMENTS; PHOTOVOLTAIC CELLS; SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS;

GLASS;

EID: 84869429358     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2012.6317640     Document Type: Conference Paper

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