Through-the-glass spectroscopic ellipsometry of superstrate solar cells and large area panels

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2011, Pages 003486-003491

  Chen, Jie ^a   Aryal, Puruswottam ^a   Li, Jian ^a   Sestak, Michelle N ^a   Dahal, Lila R ^a   Huang, Zhiquan ^a   Collins, R W ^a  

^a UNIVERSITY OF TOLEDO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COATED GLASS; DIRECT MEASUREMENT; FILM PROPERTIES; INDEX OF REFRACTION; NON DESTRUCTIVE; POLARIZATION STATE; SODA LIME GLASS; SOLAR MODULE; SPECTRAL RANGE; SUPERSTRATES;

PHOTOVOLTAIC EFFECTS; REFRACTIVE INDEX; SPECTROSCOPIC ELLIPSOMETRY; TIN;

GLASS;

EID: 84861042574     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2011.6186699     Document Type: Conference Paper

References (11)

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