Influence of incoherent superposition of light on ellipsometric coefficients

Applied Optics

Volumn 36, Issue 1, 1997, Pages 319-327

  Joerger, R ^a   Forcht, K ^a   Gombert, A ^a   Kohl M ^a   Graf, W ^a  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

Author keywords

Incoherent superposition; Refractive index of thin films; Spectroscopic ellipsometry; Transmittance ellipsometry

Indexed keywords

EID: 0005807653     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.000319     Document Type: Article

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