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Thin Solid Films

Volumn 534, Issue , 2013, Pages 149-154

Characterization of textured SnO2:F layers by ellipsometry using glass-side illumination

(3) Yamaguchi, Shinji a,b Sugimoto, Yoshio b Fujiwara, Hiroyuki a

a GIFU UNIVERSITY (Japan)

b DAINIPPON SCREEN MFG CO LTD (Japan)

Author keywords

Ellipsometry; Fluorine doped tin oxide; Texture; Thin film solar cells; Transparent conductive oxide

Indexed keywords

DIELECTRIC FUNCTIONS; FLUORINE DOPED TIN OXIDE; GLASS SUBSTRATES; LARGE-AREA GLASS SUBSTRATE; NONDESTRUCTIVE CHARACTERIZATION; SILICON THIN-FILM SOLAR CELLS; THIN FILM SOLAR CELLS; TRANSPARENT CONDUCTIVE OXIDES;

CHARACTERIZATION; ELLIPSOMETRY; F REGION; NONDESTRUCTIVE EXAMINATION; SOLAR CELLS; SPECTROSCOPIC ELLIPSOMETRY; SUBSTRATES; TEXTURES; TIN OXIDES;

GLASS;

EID: 84876671337 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2013.02.018 Document Type: Article

Times cited : (11)

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