Accurate determination of optical constants of textured SnO 2 using low incidence angle spectroscopic ellipsometry

Journal of Applied Physics

Volumn 96, Issue 10, 2004, Pages 5469-5477

  Paulson, P D ^a   Hegedus, Steven S ^a  

^a UNIVERSITY OF DELAWARE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MACROSCOPIC ROUGHNESS; OPTICAL CHARACTERIZATION TECHNIQUES; TIN OXIDE (SNO2); TRANSPARENT CONDUCTIVE OXIDES (TCO);

CHEMICAL VAPOR DEPOSITION; DATA ACQUISITION; ELLIPSOMETRY; MATHEMATICAL MODELS; POLARIMETERS; SURFACE ROUGHNESS; THIN FILMS; VECTORS;

TIN COMPOUNDS;

EID: 9944240389     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1797544     Document Type: Article

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