Toward 10 meV electron energy-loss spectroscopy resolution for plasmonics

Microscopy and Microanalysis

Volumn 20, Issue 3, 2014, Pages 767-778

  Bellido, Edson P ^a   Rossouw, David ^a   Botton, Gianluigi A ^a  

^a MCMASTER UNIVERSITY   (Canada)

Author keywords

EELS; energy resolution; plasmonics; Richardson Lucy deconvolution; STEM; surface plasmons

Indexed keywords

EID: 84903753513     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927614000609     Document Type: Conference Paper

References (32)

1. AGUIAR, J.A., REED, B.W., RAMASSE, Q.M., ERNI, R. & BROWNING, N.D. (2013). Quantifying the low-energy limit and spectral resolution in valence electron energy loss spectroscopy. Ultramicroscopy 124, 130-138.
2. BATSON, P.E., DELLBY, N. & KRIVANEK, O.L. (2002). Sub-Ångstrom resolution using aberration corrected electron optics. Nature 418(6898), 617-620.
3. BOSMAN, M., YE, E., TAN, S.F., NIJHUIS, C.A., YANG, J.K.W., MARTY, R., MLAYAH, A., ARBOUET, A., GIRARDS, C. & HAN, M.Y. (2013). Surface plasmon damping quantified with an electron nanoprobe. Sci Rep 3, 1312.
4. DUAN, H., FERNÁNDEZ-DOMÍNGUEZ, A.I., BOSMAN, M., MAIER, S.A. & YANG, J.K.W. (2012). Nanoplasmonics: Classical down to the nanometer scale. Nano Lett 12(3), 1683-1689.
5. ECCLES, J.W.L., BANGERT, U., BROMFIELD, M., CHRISTIAN, P., HARVEY, A.J. & THOMAS, P. (2010). UV-vis plasmon studies of metal nanoparticles. J Phys Conf Ser 241, 012090.
6. EGERTON, R.F. (2003). New techniques in electron energy-loss spectro-scopy and energy-filtered imaging. Micron 34(3-5), 127-139.
7. EGERTON, R.F. (2007). Limits to the spatial, energy and momentum resolution of electron energy-loss spectroscopy. Ultramicroscopy 107(8), 575-586.
8. EGERTON, R.F., QIAN, H. & MALAC, M. (2006). Improving the energy resolution of X-ray and electron energy-loss spectra. Micron 37(4), 310-315.
9. GARCÍA DE ABAJO, F.J. (2010). Optical excitations in electron microscopy. Rev Mod Phys 82(1), 209-275.
10. GLOTER, A., DOUIRI, A., TENCÉ, M. & COLLIEX, C. (2003). Improving energy resolution of EELS spectra: An alternative to the monochromator solution. Ultramicroscopy 96(3-4), 385-400.
11. HOHENESTER, U. & TRÜGLER, A. (2012). MNPBEM a Matlab toolbox for the simulation of plasmonic nanoparticles. Comput Physics Commun 183(2), 370-381.
12. ISHIZUKA, K., KIMOTO, K. & BANDO, Y. (2003). Improving energy resolution of EELS spectra by deconvolution using maximum-entropy and Richardson-Lucy algorithms. Microsc Microanal 2(9), 832-833.
13. KIMOTO, K., ISHIZUKA, K., MIZOGUCHI, T., TANAKA, I. & MATSUI, Y. (2003). The study of Al-L 23 ELNES with resolution-enhancement software and first-principles calculation. J Electron Microsc 52(3), 299-303.
14. KOH, A.L., MCCOMB, D.W., MAIER, S.A., LOW, H.Y. & YANG, J.K.W. (2010). Sub-10 nm patterning of gold nanostructures on silicon-nitride membranes for plasmon mapping with electron energy-loss spectroscopy. J Vacuum Sci Technol 28(6), C6O45-C6O49.
15. KRIVANEK, L. & KUNDMANN, M.K. (1995). Spatial resolution in EFTEM elemental maps. J Microsc 180, 277-287.
16. KRIVANEK, O., DELLBY, N. & LUPINI, A.R. (1999). Towards sub-Å electron beams. Ultramicroscopy 78(1-4), 1-11.
17. KRIVANEK, O.L., LOVEJOY, T.C., DELLBY, N. & CARPENTER, R.W. (2013). Monochromated STEM with a 30 meV-wide, atom-sized electron probe. Microscopy 62(1), 3-21.
18. KUZUO, R. & TANAKA, M. (1993). Resolution enhancement of electron energy-loss spectra using the maximum entropy method. J Electron Microsc 243, 240-243.
19. LAZAR, S., BOTTON, G.A. & ZANDBERGEN, H.W. (2006). Enhancement of resolution in core-loss and low-loss spectroscopy in a mono-chromated microscope. Ultramicroscopy 106(11-12), 1091-1103.
20. LUCY, L.H. (1974). An iterative technique for the rectification of observed distributions. Astronomical J 79(6), 745-754.
21. MAIER, S.A., BRONGERSMA, M.L. & ATWATER, H.A. (2001). Electromagnetic energy transport along arrays of closely spaced metal rods as an analogue to plasmonic devices. Appl Phys Lett 78(1), 16.
22. NELAYAH, J., KOCIAK, M., STÉPHAN, O., GARCÍA DE ABAJO, F.J., TENCÉ, M., HENRARD, L., TAVERNA, D., PASTORIZA-SANTOS, I., LIZ-MARZÁN, L.M. & COLLIEX, C. (2007). Mapping surface plasmons on a single metallic nanoparticle. Nat Phys 3(5), 348-353.
23. OVERWIJK, M. & REEFMAN, D. (2000). Maximum-entropy deconvolution applied to electron energy-loss spectroscopy. Micron 31(4), 325-331.
24. PALIK, E. (1985). Handbook of Optical Constants of Solids. Academic Press, Inc., New York.
25. PRASAD, S. (2002). Statistical-information-based performance criteria for Richardson-Lucy image deblurring. J Opt Soc Am A Opt Image Sci Vis 19(7), 1286-1296.
26. RICHARSON, W.H. (1972). Bayesian-based iterative method of image restoration. J Opt Soc Am 62(1), 55-59.
27. ROSSOUW, D. & BOTTON, G.A. (2013). Plasmonic response of bent silver nanowires for nanophotonic subwavelength waveguiding. Phys Rev Lett 110(6), 066801.
28. SHEPP, L.A. & VARDI, Y. (1982). Maximum likelihood reconstruction for emission tomography. IEEE Trans Med Imaging 1(2), 113-122.
29. SNYDER, D.L., HAMMOUD, A.M. & WHITE, R.L. (1993). Image recovery from data acquired with a charge-coupled-device camera. J Opt Soc Am 10(5), 1014-1023.
30. VAN KEMPEN, G.M.P., VAN VLIET, L.J., VERVEER, P.J. & VAN DER VOORT, H.T.M. (1997). A quantitative comparison of image restoration methods for confocal microscopy. J Microsc 185, 354-365.
31. WANG, F., EGERTON, R. & MALAC, M. (2009). Fourier-ratio deconvolution techniques for electron energy-loss spectroscopy (EELS). Ultramicroscopy 109(10), 1245-1249.
32. ZUO, J.M. (2000). Electron detection characteristics of a slow-scan CCD camera, imaging plates and film, and electron image restoration. Microsc Res Tech 49(3), 245-268.