Surface plasmon damping quantified with an electron nanoprobe

Scientific Reports

Volumn 3, Issue , 2013, Pages

  Bosman, Michel ^a   Ye, Enyi ^a   Tan, Shu Fen ^b   Nijhuis, Christian A ^b,c   Yang, Joel K W ^a   Marty, Renaud ^d   Mlayah, Adnen ^d   Arbouet, Arnaud ^d   Girard, Christian ^d   Han, Ming Yong ^a  

^a INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^c National University of Singapore   (Singapore)

^d UNIVERSITÉ DE TOULOUSE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84874296941     PISSN: None     EISSN: 20452322     Source Type: Journal    
DOI: 10.1038/srep01312     Document Type: Article

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