-
1
-
-
35949018964
-
Electron-energy-loss scattering near a single misfit dislocation at the GaAs/GaInAs interface
-
Batson P.E., Kavanah K.L., Woodall J.M., and Mayer J.W. Electron-energy-loss scattering near a single misfit dislocation at the GaAs/GaInAs interface. Phys. Rev. Lett. 57 (1986) 2729-2732
-
(1986)
Phys. Rev. Lett.
, vol.57
, pp. 2729-2732
-
-
Batson, P.E.1
Kavanah, K.L.2
Woodall, J.M.3
Mayer, J.W.4
-
2
-
-
0037626657
-
A sub-50 meV spectrometer and energy filter for use in combination with 200 kV monochromated (S)TEM
-
Brink H.A., Barfels M.M.G., Burgner R.P., and Edwards B.N. A sub-50 meV spectrometer and energy filter for use in combination with 200 kV monochromated (S)TEM. Ultramicroscopy 96 (2003) 367-384
-
(2003)
Ultramicroscopy
, vol.96
, pp. 367-384
-
-
Brink, H.A.1
Barfels, M.M.G.2
Burgner, R.P.3
Edwards, B.N.4
-
3
-
-
33646598433
-
-
De Noyer, L., 2003. RazorTools/6, part of Electronic Structure Tools, from Spectrum Square Associates. Available from: www.deconvolution.com
-
-
-
-
5
-
-
0141941110
-
New techniques in electron energy-loss spectroscopy
-
Egerton R.F. New techniques in electron energy-loss spectroscopy. Micron 34 (2003) 127-129
-
(2003)
Micron
, vol.34
, pp. 127-129
-
-
Egerton, R.F.1
-
6
-
-
2142702830
-
The use of Fourier techniques in electron energy-loss spectroscopy
-
Scanning Microscopy International, AMF O'Hare, Chicago (Suppl. 2) pp. 245-254
-
Egerton R.F., and Crozier P.A. The use of Fourier techniques in electron energy-loss spectroscopy. Scanning Microscopy (1988), Scanning Microscopy International, AMF O'Hare, Chicago (Suppl. 2) pp. 245-254
-
(1988)
Scanning Microscopy
-
-
Egerton, R.F.1
Crozier, P.A.2
-
7
-
-
0038502065
-
Improving energy resolution of EELS spectra: an alternative to the monochromator solution
-
Gloter A., Douiri A., Tence M., Imhoff D., and Colliex C. Improving energy resolution of EELS spectra: an alternative to the monochromator solution. Ultramicroscopy 96 (2003) 385-400
-
(2003)
Ultramicroscopy
, vol.96
, pp. 385-400
-
-
Gloter, A.1
Douiri, A.2
Tence, M.3
Imhoff, D.4
Colliex, C.5
-
8
-
-
33646591601
-
-
Ishizuka, K., 2004. DeConvEELS (Software EELS Monochromator). Available from: www.hremresearch.com
-
-
-
-
9
-
-
36149075804
-
Determination of the single-scattering probability distribution from plural-scattering data
-
Johnson D.W., and Spence J.C.H. Determination of the single-scattering probability distribution from plural-scattering data. J. Phys. D (Appl. Phys.) 7 (1974) 771-780
-
(1974)
J. Phys. D (Appl. Phys.)
, vol.7
, pp. 771-780
-
-
Johnson, D.W.1
Spence, J.C.H.2
-
10
-
-
0019035545
-
Iterative image restoration for linearly degraded images: II. Reblurring procedure
-
Kawata S., and Ichioka Y. Iterative image restoration for linearly degraded images: II. Reblurring procedure. J. Opt. Soc. Am. 70 (1980) 768-772
-
(1980)
J. Opt. Soc. Am.
, vol.70
, pp. 768-772
-
-
Kawata, S.1
Ichioka, Y.2
-
11
-
-
0037777540
-
The study of Al-L23 ELNES with resolution-enhancement software and first-principles calculation
-
Kimoto K., Ishizuka K., Mizuguchi T., Tanaka I., and Matsui Y. The study of Al-L23 ELNES with resolution-enhancement software and first-principles calculation. J. Electron Microsc. 36 (2003) 299-303
-
(2003)
J. Electron Microsc.
, vol.36
, pp. 299-303
-
-
Kimoto, K.1
Ishizuka, K.2
Mizuguchi, T.3
Tanaka, I.4
Matsui, Y.5
-
12
-
-
20144381215
-
0.23 eV energy resolution obtained using cold field emission gun and streak imaging technique
-
Kimoto K., Ishizuka K., Asaka T., Nagai T., and Matsui Y. 0.23 eV energy resolution obtained using cold field emission gun and streak imaging technique. Micron 36 (2005) 465-470
-
(2005)
Micron
, vol.36
, pp. 465-470
-
-
Kimoto, K.1
Ishizuka, K.2
Asaka, T.3
Nagai, T.4
Matsui, Y.5
-
13
-
-
0342282358
-
Superresolution limit for signal recovery
-
Skilling J. (Ed), Kluwer Academic Publishers, Dordrecht
-
Kosarev E.L. Superresolution limit for signal recovery. In: Skilling J. (Ed). Maximum Entropy and Bayesian Methods (1989), Kluwer Academic Publishers, Dordrecht 475-480
-
(1989)
Maximum Entropy and Bayesian Methods
, pp. 475-480
-
-
Kosarev, E.L.1
-
14
-
-
0038502004
-
Materials science applications of HREELS in near edge structure analysis and low-energy loss spectroscopy
-
Lazar S., Botton G.A., Wu M.-Y., Tichelaar F.D., and Zandbergen H.W. Materials science applications of HREELS in near edge structure analysis and low-energy loss spectroscopy. Ultramicroscopy 96 (2003) 535-546
-
(2003)
Ultramicroscopy
, vol.96
, pp. 535-546
-
-
Lazar, S.1
Botton, G.A.2
Wu, M.-Y.3
Tichelaar, F.D.4
Zandbergen, H.W.5
-
15
-
-
0001050714
-
An iterative technique for the rectification of observed distributions
-
Lucy L.B. An iterative technique for the rectification of observed distributions. Astron. J. 79 (1974) 745-755
-
(1974)
Astron. J.
, vol.79
, pp. 745-755
-
-
Lucy, L.B.1
-
16
-
-
0034059470
-
Maximum-entropy deconvolution applied to electron energy-loss spectroscopy
-
Overwijk M.H.F., and Reefman D. Maximum-entropy deconvolution applied to electron energy-loss spectroscopy. Micron 31 (2000) 325-331
-
(2000)
Micron
, vol.31
, pp. 325-331
-
-
Overwijk, M.H.F.1
Reefman, D.2
-
17
-
-
33646541434
-
Towards higher resolution: a mathematical approach
-
Defect and Microstructure Analysis by Diffraction. Snyder R.L. (Ed), Oxford University Press, Oxford
-
Reefman D. Towards higher resolution: a mathematical approach. In: Snyder R.L. (Ed). Defect and Microstructure Analysis by Diffraction. International Union of Crystallographica Series vol. 10 (2000), Oxford University Press, Oxford 652-670
-
(2000)
International Union of Crystallographica Series
, vol.10
, pp. 652-670
-
-
Reefman, D.1
-
18
-
-
0002594849
-
Bayesian iterative method of image restoration
-
Richardson W.H. Bayesian iterative method of image restoration. J. Opt. Soc. Am. 62 (1972) 55-59
-
(1972)
J. Opt. Soc. Am.
, vol.62
, pp. 55-59
-
-
Richardson, W.H.1
-
19
-
-
0041422287
-
Improvements to energy resolution of an X-ray energy dispersive spectrum by deconvolution using the zero strobe peak
-
Watanabe M., and Williams D.B. Improvements to energy resolution of an X-ray energy dispersive spectrum by deconvolution using the zero strobe peak. Microsc. Microanal. 9 Suppl. 2 (2003) 124-125
-
(2003)
Microsc. Microanal.
, vol.9
, Issue.SUPPL. 2
, pp. 124-125
-
-
Watanabe, M.1
Williams, D.B.2
-
20
-
-
33646582053
-
-
Wu, L., 2004. Personal communication.
-
-
-
|