Fourier-ratio deconvolution techniques for electron energy-loss spectroscopy (EELS)

Ultramicroscopy

Volumn 109, Issue 10, 2009, Pages 1245-1249

  Wang, Feng ^a   Egerton, Ray ^a,b   Malac, Marek ^a,b  

^a NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^b UNIVERSITY OF ALBERTA   (Canada)

Author keywords

Bulk plasmon; Electron energy loss spectroscopy (EELS); Fourier ratio deconvolution; Interface plasmon; Plural scattering; Richardson Lucy (RL) deconvolution; Surface plasmon

Indexed keywords

BULK PLASMON; ELECTRON ENERGY-LOSS SPECTROSCOPY (EELS); FOURIER-RATIO DECONVOLUTION; INTERFACE PLASMON; PLURAL SCATTERING; RICHARDSON-LUCY (RL) DECONVOLUTION; SURFACE PLASMON;

CONVOLUTION; DISSOCIATION; ELECTRON SCATTERING; FOURIER TRANSFORMS; PLASMONS;

ELECTRON ENERGY LOSS SPECTROSCOPY;

ALGORITHM; ARTICLE; BAYES THEOREM; CHEMICAL COMPOSITION; CONTROLLED STUDY; ELECTRON ENERGY LOSS SPECTROSCOPY; FOURIER ANALYSIS; SURFACE PLASMON RESONANCE; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 68549109380     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.05.011     Document Type: Article

References (23)

1. Egerton R.F. Electron Energy-Loss Spectroscopy in the Electron Microscope. second ed. (1996), Springer, Berlin
2. Brydson R. Electron Energy Loss Spectroscopy (2001), Bios, Oxford
3. Batson P.E., Johnson D.W., and Spence J.C.H. Ultramicroscopy 41 (1992) 137
4. Rafferty B., Pennycook S., and Brown L. J. Electron Microsc. 49 (2000) 517
5. Stöger-Pollach M. Micron 39 (2008) 1092
6. Egerton R.F., and Crozier P.A. Scanning Electron Microsc. Suppl. 2 (1988) 245
7. Kuzuo R., and Tanaka M. J. Electron Microsc. 42 (1993) 240
8. Overwijk M.H.F., and Reefman D. Micron 31 (2000) 325
9. Gloter A., Douiri A., Tence M., Imhoff D., and Colliex C. Ultramicroscopy 96 (2003) 385
10. Kimoto K., Ishizuka K., Mizuguchi T., Tanaka I., and Matsui Y. J. Electron Microsc. 36 (2003) 299
11. Lazar S., Botton G.A., and Zandbergen H.W. Ultramicroscopy 106 (2006) 1091
12. Egerton R.F., Qian H., and Malac M. Micron 37 (2006) 310
13. Egerton R.F., and Whelan M.J. Philos. Mag. 30 (1974) 739
14. Johnson D.W., and Spence J.C.H. J. Phys. D (Appl. Phys.) 7 (1974) 771
15. Egerton R.F., and Wang Z.L. Ultramicroscopy 32 (1990) 137
16. Egerton R.F., Wang F., Malac M., Moreno M.S., and Hofer F. Micron 39 (2007) 642
17. Howie A., and Walsh C. Microsc. Microanal. Microstruct. 2 (1991) 171
18. Neyer T., Schattschneider P., Bolton J.P.R., and Botton G.A. J. Microsc. 187 (2003) 184
19. Jewsbury P., and Summerside P. J. Phys. F: Metal Phys. 10 (1980) 645
20. Batson P.E. Ultramicroscopy 9 (1982) 277
21. Ouyang F., and Isaacson M. Ultramicroscopy 31 (1989) 345
22. Acheche M., Colliex C., Kohl H., Nourtier A., and Trebbia P. Ultramicroscopy 20 (1986) 99
23. K.A. Mkhoyan, T. Babinec, S.E. Maccagnano, E.J. Kirkland, J. Silcox, Ultramicroscopy 107 (2007) 345.