Enhancement of resolution in core-loss and low-loss spectroscopy in a monochromated microscope

Ultramicroscopy

Volumn 106, Issue 11-12 SPEC. ISS., 2006, Pages 1091-1103

  Lazar, S ^a   Botton, G A ^a,b   Zandbergen, H W ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b MCMASTER UNIVERSITY   (Canada)

Author keywords

Bandgap measurements; Deconvolution methods; High resolution electron energy loss spectroscopy

Indexed keywords

ALGORITHMS; DETECTORS; DIFFRACTION; OPTICAL RESOLVING POWER; OPTICAL TRANSFER FUNCTION; SPECTROSCOPIC ANALYSIS;

BANDGAP MEASUREMENTS; DECONVOLUTION METHODS; HIGH-RESOLUTION ELECTRON ENERGY-LOSS SPECTROSCOPY; MONOCHROMATED SPECTRA;

ELECTRON MICROSCOPES;

ALGORITHM; ARTICLE; ENTROPY; IMAGING; MATHEMATICAL ANALYSIS; MICROSCOPY; OPTICAL RESOLUTION; SIGNAL NOISE RATIO; SPECTROSCOPY;

EID: 33749236043     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2006.04.024     Document Type: Article

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