Non-invasive transmission electron microscopy of vacancy defects in graphene produced by ion irradiation

Nanoscale

Volumn 6, Issue 12, 2014, Pages 6569-6576

  Lehtinen, Ossi ^a   Tsai, I Ling ^b   Jalil, Rashid ^b   Nair, Rahul R ^b   Keinonen, Juhani ^c   Kaiser, Ute ^a   Grigorieva, Irina V ^b  

^a UNIVERSITY OF ULM   (Germany)

^b UNIVERSITY OF MANCHESTER   (United Kingdom)

^c UNIVERSITY OF HELSINKI   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; ELECTRONIC STRUCTURE; IONS; IRRADIATION; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC-SCALE DEFECTS; ENGINEERING TOOLS; GRAPHENE SHEETS; HIGH-ENERGY IONS; HIGH-RESOLUTION TRANSMISSION MICROSCOPIES; MAGNETIC AND TRANSPORT PROPERTIES; MECHANICAL CHARACTERISTICS; VACANCY DEFECTS;

GRAPHENE;

EID: 84901747637     PISSN: 20403364     EISSN: 20403372     Source Type: Journal    
DOI: 10.1039/c4nr01918k     Document Type: Article

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