Generation of 1020 Wcm-2 hard X-ray laser pulses with two-stage reflective focusing system

Nature Communications

Volumn 5, Issue , 2014, Pages

  Mimura, Hidekazu ^a   Yumoto, Hirokatsu ^b   Matsuyama, Satoshi ^c   Koyama, Takahisa ^b   Tono, Kensuke ^b   Inubushi, Yuichi ^d   Togashi, Tadashi ^b   Sato, Takahiro ^d   Kim, Jangwoo ^c   Fukui, Ryosuke ^c   Sano, Yasuhisa ^c   Yabashi, Makina ^d   Ohashi, Haruhiko ^b,d   Ishikawa, Tetsuya ^d   Yamauchi, Kazuto ^c  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^c OSAKA UNIVERSITY   (Japan)

^d RIKEN SPring 8 Center   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL EQUIPMENT; ARTICLE; CAMERA; DENSITY; FOURIER TRANSFORMATION; GRATING INTERFEROMETER; INTERFEROMETER; INTERFEROMETRY; LASER; LIGHT; OPTICS; PHYSICS; RADIATION RELATED PHENOMENA; TWO STAGE REFLECTIVE FOCUSING SYSTEM; VISUAL SYSTEM; X RAY; X RAY FREE ELECTRON LASER; X RAY FREE ELECTRON LASER PULSE;

EID: 84899839965     PISSN: None     EISSN: 20411723     Source Type: Journal    
DOI: 10.1038/ncomms4539     Document Type: Article

References (25)

1. Ackermann, W. et al. Operation of a free-electron laser from the extreme ultraviolet to the water window. Nat. Photon. 1, 336-342 (2007).
2. Shintake, T. et al. A compact free-electron laser for generating coherent radiation in the extreme ultraviolet region. Nat. Photon. 2, 555-559 (2008).
3. Allaria, E. et al. Highly coherent and stable pulses from the FERMI seeded freeelectron laser in the extreme ultraviolet. Nat. Photon. 6, 699-704 (2012).
4. Emma, P. et al. First lasing and operation of an ångstrom- wavelength free electron laser. Nat. Photon. 4, 641-647 (2010).
5. Ishikawa, T. et al. A compact X-ray free-electron laser emitting in the subångstro ̈m region. Nat. Photon. 6, 540-544 (2012).
6. Yamauchi, K. et al. Nearly diffraction-limited line focusing of a hard-X-ray beam with an elliptically figured mirror. J. Synchrotron Rad. 9, 313-316 (2002).
7. Mimura, H. et al. Efficient focusing of hard X rays to 25nm by a total reflection mirror. Appl. Phys. Lett. 90, 051903 (2007).
8. Mimura, H. et al. Breaking the 10 nm barrier in hard-X-ray focusing. Nat. Phys. 6, 122-125 (2010).
9. Yamauchi, K. et al. Single-nanometer focusing of hard X-rays by Kirkpatrick-Baez mirrors. J. Phys. Condens. Matter 23, 394206 (2011).
10. Yumoto, H. et al. Focusing of X-ray free-electron laser pulses with reflective optics. Nat. Photon. 7, 43-47 (2013).
11. David, C. et al. Nanofocusing of hard X-ray free electron laser pulses using diamond based Fresnel zone plates. Sci. Rep. 1, 57 (2011).
12. Schropp, A. et al. Full spatial characterization of a nanofocused x-ray freeelectron laser beam by ptychrographic imaging. Sci. Rep. 3, 1633 (2013).
13. Young, L. et al. Femtosecond electronic response of atoms to ultra-intense X-rays. Nature 466, 56-61 (2007).
14. Tamasaku, K. et al. Double core-hole creation by sequential attosedond photoionization. Phys. Rev. Lett. 111, 043001 (2013).
15. Yumoto, H. et al. Fabrication of elliptically figured mirror for focusing hard x-rays to size less than 50 nm. Rev. Sci. Instrum. 76, 063708 (2005).
16. Kirkpatrick, P. & Baez, A. V. Formation of optical images by X-rays. J. Opt. Soc. Am. 38, 766-774 (1948).
17. Amemiya, K., Sako, E. O., Miyawaki, J. & Abe, H. Two-step Kirkpatrick-Baez system: compact optics for X-ray microfocusing. Jpn J. Appl. Phys. 46(6A): 3640-3643 (2007).
18. Yamauchi, K., Mimura, H., Inagaki, K. & Mori, Y. Figuring with subnanometerlevel accuracy by numerically controlled elastic emission machining. Rev. Sci. Instrum. 73, 4028-4033 (2002).
19. Yamauchi, K. et al. Microstitching interferometry for X-ray reflective optics. Rev. Sci. Instrum. 74, 2894-2898 (2003).
20. Mimura, H. et al. Relative angle determinable stitching interferometry for hard-X-ray reflective optics. Rev. Sci. Instrum. 76, 045102 (2005).
21. Rutishauser, S. et al. Exploring the wavefront of hard X-ray free-electron laser radiation. Nat. Commun. 3, 947 (2012).
22. Yashiro, W. Efficiency of capturing a phase image using cone-beam x-ray Talbot interferometry. J. Opt. Soc. Am. A 8, 2025-2039 (2008).
23. Matsuyama, S. et al. Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry. Opt. Express 20(22): 24977-24986 (2012).
24. Inubushi, Y. et al. Determination of the pulse duration of an X-ray free electron laser using highly resolved single-shot spectra. Phys. Rev. Lett. 109, 144801 (2012).
25. Tono, K. et al. Single-shot beam-position monitor for x-ray free electron laser. Rev. Sci. Instrum. 82, 023108 (2011).