Two-step Kirkpatrick-Baez system: Compact optics for X-ray microfocusing

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 46, Issue 6 A, 2007, Pages 3640-3643

  Amemiya, Kenta ^a   Sako, Erika O ^a   Miyawaki, Jun ^b   Abe, Hitoshi ^b,c  

^a INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

^c JAPAN SOCIETY FOR THE PROMOTION OF SCIENCE   (Japan)

Author keywords

High demanificatoon; Microfocusing; Two step Kirkpatrick Baez system; X ray optics

Indexed keywords

COMPUTER SIMULATION; OPTICAL SYSTEMS; RAY TRACING;

HIGH DEMANIFICATOON; MICROFOCUSING; TWO STEP KIRKPATRICK BAEZ SYSTEMS;

X RAY OPTICS;

EID: 34547842107     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.46.3640     Document Type: Article

References (4)

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3. S. Matsuyama, H. Mimura, H. Yumoto, Y. Sano, K. Yamamura, M. Yabashi, Y. Nishino, K. Tamasaku, T. Ishikawa, and K. Yamauchi: Rev. Sci. Instrum. 77 (2006) 103102.
4. K. Amemiya, H. Kondoh, T. Yokoyama, and T. Ohta: J. Electron Spectrosc. Relat. Phenom, 124 (2002) 151.