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Volumn 251, Issue 4, 2014, Pages 788-791

Determination of polar C-plane and nonpolar A-plane AlN/GaN heterojunction band offsets by X-ray photoelectron spectroscopy

Author keywords

Polarization; Semiconductor heterojunctions; Valence band offsets; X ray photoelectron spectroscopy

Indexed keywords

ALUMINUM NITRIDE; HETEROJUNCTIONS; III-V SEMICONDUCTORS; PHOTOELECTRONS; PHOTONS; POLARIZATION; WIDE BAND GAP SEMICONDUCTORS; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC SULFIDE;

EID: 84899462328     PISSN: 03701972     EISSN: 15213951     Source Type: Journal    
DOI: 10.1002/pssb.201350199     Document Type: Article
Times cited : (20)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.