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Volumn 97, Issue 25, 2010, Pages

Electronic structures of c -plane and a -plane AlN/ZnO heterointerfaces determined by synchrotron radiation photoemission spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

A-PLANE; ALN; ALN FILMS; CONDUCTION BAND OFFSET; HETERO-INTERFACES; ROOM TEMPERATURE; SPONTANEOUS POLARIZATIONS; SYNCHROTRON RADIATION PHOTOEMISSION SPECTROSCOPY; VALENCE-BAND MAXIMUMS; VALENCE-BAND OFFSET; ZNO; ZNO SUBSTRATE;

EID: 78650746068     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3530445     Document Type: Article
Times cited : (13)

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