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Volumn 94, Issue 16, 2009, Pages

Measurement of polar C -plane and nonpolar A -plane InN/ZnO heterojunctions band offsets by x-ray photoelectron spectroscopy

(10) Yang, A L a Song, H P a Wei, H Y a Liu, X L a Wang, J a Lv, X Q a Jin, P a Yang, S Y a Zhu, Q S a Wang, Z G a

a INSTITUTE OF SEMICONDUCTORS (China)

Author keywords

[No Author keywords available]

Indexed keywords

A PLANES; BAND OFFSETS; CONDUCTION BAND OFFSETS; NON-POLAR; SPONTANEOUS POLARIZATION EFFECTS; VALENCE BAND OFFSETS; WURTZITE; X-RAY PHOTOELECTRON SPECTROSCOPIES;

ELECTRIC CONDUCTIVITY; ELECTRON MOBILITY; ELECTRON SPECTROSCOPY; HETEROJUNCTIONS; PHOTOELECTRICITY; PHOTOIONIZATION; PHOTONS; SPECTRUM ANALYSIS; VALENCE BANDS; ZINC SULFIDE;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 65449133176 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3123814 Document Type: Article

Times cited : (29)

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