Design of an automatic testing for FPGAS

Proceedings - European Test Workshop 1999, ETW 1999

Volumn , Issue , 1999, Pages 152-157

  Doumar, Abderrahim ^a   Ohmameuda, Toshiaki ^a   Ito, Hideo ^a  

^a CHIBA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; FIELD PROGRAMMABLE GATE ARRAYS (FPGA); INTEGRATED CIRCUIT DESIGN; STATIC RANDOM ACCESS STORAGE;

CAD TOOL; MODIFIED A; MULTIPLE FAULTS; OFF-CHIP MEMORY; ON CHIPS; TEST DATA;

COMPUTER AIDED DESIGN;

EID: 84895122640     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETW.1999.804522     Document Type: Conference Paper

References (13)

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