Detection of bridging faults in logic resources of configurable FPGAs using IDDQ

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 1037-1046

  Zhao, L ^a   Walker, D M H ^a   Lombardi, F ^a  

^a NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FAULT CURRENTS; ELECTRIC FAULT LOCATION; FORMAL LOGIC; INTEGRATED CIRCUIT TESTING; RANDOM ACCESS STORAGE; VECTORS;

BRIDGING FAULTS; CONFIGURABLE LOGIC BLOCKS (CLB);

FIELD PROGRAMMABLE GATE ARRAYS;

EID: 0032320309     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (29)